Quantification of Interfacial Segregation by Atom Probe Field Ion Microscopy
نویسندگان
چکیده
منابع مشابه
Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscale microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy i...
متن کاملAutomated atom-by-atom 3D reconstruction of field ion microscopy data
An automated procedure has been developed for the 3D reconstruction of field ion microscopy (FIM) data that maintains the atomistic nature of the technique. FIM characterises individual atoms on the surface of a specimen, that is evolving subject to the process of field evaporation, in a series of 2D time-ordered images. It’s unique spatial resolution enables the direct imaging of crystal defec...
متن کاملCold-atom scanning probe microscopy.
Scanning probe microscopes are widely used to study surfaces with atomic resolution in many areas of nanoscience. Ultracold atomic gases trapped in electromagnetic potentials can be used to study electromagnetic interactions between the atoms and nearby surfaces in chip-based systems. Here we demonstrate a new type of scanning probe microscope that combines these two areas of research by using ...
متن کاملPrecipitates in Al–Cu alloys revisited: Atom-probe tomographic experiments and first-principles calculations of compositional evolution and interfacial segregation
Atom-probe tomography, transmission electron microscopy, X-ray diffraction and first-principles calculations are employed to study: (i) compositional evolution of GPII zones and h0 precipitates; and (ii) solute segregation at a-Al/h0 interfaces in Al–1.7 at.% Cu (Al–4 wt.% Cu) alloys. GPII zones are observed after aging at 438 K for 8 h, whereas higher aging temperatures, 463 K for 8 h and 533 ...
متن کاملA Time-of-flight Atom-probe Field-ion Microscope for the Study of Defects in Metals
An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 1997
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927600009533